X-Ray Diffraction
X-ray Diffraction (XRD) is a non-destructive analytical technique that provides information about the crystalline structure, chemical composition, and physical properties of materials and thin layers of crystalline materials. These techniques depend on monitoring the scattering intensity of an X-ray beam incident on the sample as a function of the angle of incidence and scattering, as well as polarization. It is used to identify the crystal structure of various solid samples.
The technique relies on constructive (in-phase) interference of monochromatic X-rays and electrons in a crystalline sample or powder. When a beam of X-ray photons strikes the electrons of an atom, some photons undergo elastic scattering (without energy transfer) and inelastic scattering (with energy transfer).
According to Bragg’s Law, X-ray diffraction is used to determine the following:
• Determining the state of matter: Amorphous or Crystalline
• Determining the percentage of Linty Crystal
• Studying the crystal structure of the material
• Thin film analysis
• Identifying the degree of homogeneity of the material or mixture
• Determining the unit cell size
